Скачать презентацию
Идет загрузка презентации. Пожалуйста, подождите
Презентация была опубликована 6 лет назад пользователемShakhnoza Alieva
2 A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons SEM Specimens can be observed in high vacuum in conventional SEM, or in low vacuum or wet conditions in variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments SEM can achieve resolution better than 1 nanometer.
Еще похожие презентации в нашем архиве:
© 2024 MyShared Inc.
All rights reserved.